Mixed-signal test suite porting for IC mfg

Ported an entire suite of analog tests written for a Sentry-based load board into highly readable, manageable routines written for a super set load board capable of complete digital control with a register interface instead of a relay-driven one. Wrote detailed register-level description of the load board and created hi-level, block diagrams to explain and confirm its operation at hi level. This code supported the wafer sort environment as well as the single-slave standalone environment. The host computer was a Mac with an attached instrument box providing DACs and ADCs. This served as the basis for the program in the by-4 environment.